| Similarity | Rank | |
|---|---|---|
| high-precision | 0.776 | 83678 |
| MEMS | 0.765 | 50867 |
| machining | 0.734 | 27247 |
| computer-aided | 0.727 | 71534 |
| calibration | 0.722 | 19555 |
| semiconductor | 0.721 | 23279 |
| spectroscopy | 0.712 | 40691 |
| imaging | 0.710 | 7334 |
| measurement | 0.708 | 6043 |
| GNSS | 0.703 | 85164 |
| repeatability | 0.697 | 67220 |
| CMM | 0.695 | 77671 |
| optics | 0.695 | 21287 |
| engineering | 0.694 | 2745 |
| nanoscale | 0.692 | 60133 |
| Agilent | 0.691 | 76385 |
| fabrication | 0.690 | 17069 |
| lithography | 0.689 | 70142 |
| photonic | 0.689 | 85991 |
| computational | 0.685 | 18710 |
| prototyping | 0.682 | 31947 |
| analytical | 0.682 | 10962 |
| semiconductors | 0.681 | 51843 |
| analyzers | 0.680 | 70402 |
| spectrometer | 0.680 | 58861 |