Similarity | Rank | |
---|---|---|
high-precision | 0.776 | 83678 |
MEMS | 0.765 | 50867 |
machining | 0.734 | 27247 |
computer-aided | 0.727 | 71534 |
calibration | 0.722 | 19555 |
semiconductor | 0.721 | 23279 |
spectroscopy | 0.712 | 40691 |
imaging | 0.710 | 7334 |
measurement | 0.708 | 6043 |
GNSS | 0.703 | 85164 |
repeatability | 0.697 | 67220 |
CMM | 0.695 | 77671 |
optics | 0.695 | 21287 |
engineering | 0.694 | 2745 |
nanoscale | 0.692 | 60133 |
Agilent | 0.691 | 76385 |
fabrication | 0.690 | 17069 |
lithography | 0.689 | 70142 |
photonic | 0.689 | 85991 |
computational | 0.685 | 18710 |
prototyping | 0.682 | 31947 |
analytical | 0.682 | 10962 |
semiconductors | 0.681 | 51843 |
analyzers | 0.680 | 70402 |
spectrometer | 0.680 | 58861 |